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SN74BCT8374ADW
| Manufacturer | Texas Instruments |
|---|---|
| Description | IC SCAN TEST DEVICE W/FF 24-SOIC |
| Datasheet |
 Datasheet
|
Product Attributes
| Type | Description |
|---|---|
| Mfr Part Number | SN74BCT8374ADW |
| Mfr | Texas Instruments |
| Description | IC SCAN TEST DEVICE W/FF 24-SOIC |
| Min Qty | 1 |
| Package | Tube |
| Series | 74BCT |
| Product Status | Active |
| Operating Temperature | 0°C ~ 70°C |
| Mounting Type | Surface Mount |
| Package Case | 24-SOIC (0.295", 7.50mm Width) |
| Supplier Device Package | 24-SOIC |
| Number Of Bits | 8 |
| Logic Type | Scan Test Device with D-Type Edge-Triggered Flip-Flops |
| Supply Voltage | 4.5V ~ 5.5V |